Record High-Power Single-Mode VCSELs using Strain-Controlled Impurity-Induced Disordering Apertures

Patrick Su demonstrates record high-power single-mode performance in VCSELs using strain-controlled impurity-induced disordering apertures. Oxide-VCSELs of aperture sizes from 9-13 um are shown to achieve record single-mode output powers of 8.52 mW, 9.57 mW, 10.20 mW, 10.57 mW, and 10.95 mW respectively.

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