Optics-based Biotechnology Development and Thin Film Analysis
I had highly interdisciplinary experience during my PhD research. The research goal was to develop optics-based methods for ultra-thin film (Thickness: pm to nm) analysis, and apply these methods to biomedical research and condensed matter study. In four years In Prof. David Nolte group at Purdue University, I developed three optics-based biosensors which enable label-free detection of prostate specific antigen in patient serum. These inventions were awarded 3 patents. I also developed a method called picometrology to study optical properties of graphene, gold and water nanofilm. Picometrology can sense thin film thickness with 2 pm sensitivity and measure its complex refractive index, with a performance superior to conventional SPR-based sensor (surface plasmon resonance).
My Ph.D. training in a highly interdisciplinary manner shaped me into a versatile researcher. I became an expert in optical instrument development, computer coding, nanofabrication, and biological and chemical analysis. Such experience is valuable for my future research.
X. F. Wang et al., Applied Optics 46, (2007)
X. F. Wang et al., Applied Optics 47, (2008)
X. F. Wang et al., Biosensors & Bioelectronics 24, (2008)
X. F. Wang, and et al., Anal. and Bioanal. Chem. 393, (2009)
X. F. Wang, and et al., Biosensors& Bioelectronics 26, (2011)
X. F. Wang et al. Optics Letters. 37, (2012)
X. F. Wang et al. Appl. Phys. Lett. 93, (2008)
Selected in research highlights, Nature Physics, 5 (2009)
Project 5: To demonstrate the capability of the interference-based biosensor, I measured the hydroxyl film growth on silica surface in real-time, achieving 2 pm sensitivity.
X. F. Wang et al., Applied Physics Letters 97, (2010)
Project 7 & 8: Using Picometrology, I measured complex refractive index of graphene at single wavelengths for the first time. I also explored the optical conditions to amplify graphene visibility on dielectric coatings.
X. F. Wang et al., Optics Express 16, (2008)
X. F. Wang et al., Appl. Phys. Lett. 95, (2008)
selected to Virtual Journal of Nanoscale Science & Technology
X F Wang et al.,Optics Express. 18, (2010)