Ji Sun Choi’s recent paper shows novel method of label-free imaging of stem cell adhesion

In conjunction with Professor Brian Cunningham’s Nano Sensors group of the University of Illinois Electrical & Computer Engineering and Bioengineering, Dr. Ji Sun Choi of the Harley Lab has employed Photonic Crystal Enhanced Microscopy to monitor and quantitatively measure stem cell adhesion in a novel, label-free method that enables live-cell imaging. Adhesion is a critical process that regulates stem cell migration, differentiation, division, and cell death, and can be used to understand how stem cells react to the surrounding environment. This information will be used to inform future studies on stem cell fate decisions, and expanded to how diseases like cancer spread. Read more here…